Zhuzhou Sanxin Cemented Carbide Manufacturing Co., Ltd

Zhuzhou Sanxin Cemented Carbide Manufacturing Co., Ltd

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Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing

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Zhuzhou Sanxin Cemented Carbide Manufacturing Co., Ltd
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City:zhuzhou
Province/State:hunan
Country/Region:china
Contact Person:MsAnne Zhang
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Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing

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Brand Name :Sanxin
Model Number :SX1407
Certification :ISO9001
Place of Origin :Zhuzhou,China
MOQ :2
Payment Terms :L/C,T/T,Western Union
Delivery Time :5-25days
Item Name :Tungsten Needle
Characters :Wear- resistance, Anti-corrosion
Hardness :HRA 90-92
Advantage :High Wear Resistance,Long Life
Shape :Pin
Carbide Grade :Yg6, Yg8, Yg10, etc
Surface Treatment :Well ground and polished
Service :ODM,OEM,OEM&ODM
Quality Grade :K30,YG10X,K40,P10...
Main Feature :Wear-Resistant
Tolerance :h6
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Micron-grade Conductive Pioneer Nickel-plated Custom Tungsten Carbide Needle


The precision probe with electroplated nickel layer, with ultra-low contact resistance of 0.02Ω and HV500 hardness coating, overcomes the wear and oxidation pain points of ordinary gold-plated needles, and achieves zero-attenuation transmission of microampere-level signals in the fields of semiconductor testing and medical electrodes.


Spec-matrix:


Parameter Standard Value Ultimate Accuracy Test Standard
Diameter Range Φ0.1-2.0mm Φ0.05mm (Microneedle Laser Diameter Gauge
Coating Thickness 5±0.5μm ±0.2μm XRF Spectrometer
Straightness ≤0.003mm/30mm 0.001mm/30mm VDI 2617
Coating Hardness HV500±50 Nanoindenter Fully Tested ISO 14577
Contact Resistance 0.02Ω±0.005Ω Four-Wire Measurement IEC 60512

Note: The above data is for reference only, please contact us for customization.


Performance Advantages:


- Contact Resistance: 0.02-0.05Ω (90% lower than stainless steel pins)
- Wear Life: >1,000,000 plug-in/plug cycles
- Corrosion Resistance: Passed 96h salt spray test


Application:


Semiconductor Testing
- Wafer-Level Probe Card (0.1mm Φ Microneedle Array)
- BGA Package Testing (50μm Pitch Continuity)
- Third-Generation GaN Semiconductor Device Testing (High Temperature Resistance up to 400°C)


Medical Electronics
- Implantable Neural Electrodes (Biocompatibility Certified)
- Blood Glucose Monitor Probes (Resistant to Antibody Corrosion)
- Endoscope Contacts (>500 Sterilization Cycles)


Precision Industry
- PCB Flying Probe Testing (0.3mm Continuity)
- New Energy Battery Probes (Resistant to Electrolyte Corrosion)
- Micro Connectors (Insertion and Removal Force ≤0.5N)


Nickel-Plated Tungsten Carbide Needle for Semiconductor Testing


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